Material properties
Item | Specifications | Test Method |
Growth method | Czochralski technique | -- |
Crystallinity | Monocrystalline | -- |
Conductive type | N-type | PN testing machine |
Dimensions | M10：182.2*183.75 φ256mm G12：210*210 φ295mm G12-R：182.3*210 φ272mm | AOI |
Thickness | M10：90-160µm G12：90-160µm G12R：90-160µm | AOI |
Electrical properties
Item | Specifications | Test Method |
Resistivity | 0.6-1.6<Ω·cm> | AOI |
Lifetime | ≥800<µs> | BCT-400 |
Oxygen content | ≤12<ppma> | FTIR (ASTM F121-83) |
Carbon content | ≤1<ppma> | FTIR (ASTM F123-91) |
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