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P-type Wafer

Introduction:

● Mature Process and Advanced Equipment

● Precise customization to meet specific customer requirements

● Low attenuation process


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Product details


Material properties



Item



Specifications


Test Method


Growth method



CZ


--


Crystallinity



Monocrystalline


--


Conductive type



P-type


PN testing machine


Dimensions


M10:182.2*182.2  φ247mm
G12:210*210  φ295mm


AOI


Thickness


M10:90-160µm
G12:90-160µm


AOI




Electrical properties



Item



Specifications


Test Method


Resistivity



0.4-1.1 <Ω·cm>


AOI


Lifetime



≥ 70 <µs>


BCT-400


Oxygen content



≤16<ppma>


FTIR (ASTM F121-83)


Carbon content



≤1<ppma>


FTIR (ASTM F123-91)


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